MODEL OF MOTION OF THE PROBE
OF AN ATOMIC-FORCE MICROSCOPE
IN THE SEMICONTACT REGIME

S. O. Abetkovskaya and S. A. Chizhik

UDC 539.3

The equation of motion of the oscillating probe of an 
atomic-force microscope in the field of surface forces of an elastic 
sample was numerically solved. The influence of the position of the 
probe and the elastic modulus of the sample on the dynamic parameters 
of the probe motion and the characteristics of the contact deformation 
of the sample was estimated.

A. V. Luikov Heat and Mass Transfer Institute, National 
Academy of Sciences of Belarus, 15 P. Brovka Str., Minsk, 220072, 
Belarus. Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 80, 
No. 2, pp. 173-179, March-April, 2007. Original article submitted 
October 5, 2006.