ON SUPERDEEP PENETRATION OF A MULTIPARTICLE FLUX AND 
DAMAGE OF ELECTRONIC ELEMENTS POSITIONED BEHIND AN OBSTACLE

A. I. Belous,a O. A. Dybov,b 
G. S. Romanov,c  S. M. Usherenko,d  
And S. V. Shvedova 

UDC 534.2

Tracks of the material of microparticles interacting with 
a metallic obstacle and a detector positioned behind it are presented. 
The experimental data obtained show that the degree of damage of microcircuits 
positioned behind an obstacle depends on the material of the particles 
acting on it.

a"Belmikrosistemy" Unitary 
Enterprise, "Integral" Scientific-Production Association, Minsk, Belarus; 
bScientific-Research Institute of Pulsed 
Processes, "Powder Metallurgy" Concern, National Academy of Sciences 
of Belarus, Minsk, Belarus; cA. V. Luikov 
Heat and Mass Transfer Institute, National Academy of Sciences of 
Belarus, 15 P. Brovka Str., Minsk, 220072, Belarus; 
dInstitute of Raising the Level of Professional Skill, Ministry 
of Education of the Republic of Belarus, 77 Partizanskii Ave., Minsk, 
220600, Belarus. Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 
77, No. 3, pp. 144-146, May-June, 2004. Original article submitted 
December 8, 2003.